New HR-TEM installation in progress in Nanomicroscopy Center
New high throughput nano-analysis TEM is planned to be operational during Jan 2016
A JEOL JEM-2800 high-throughput, high-resolution TEM system is currently being installed to Nanomicroscopy Center.
This versatile TEM features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS) for chemical analysis; TEM/STEM tomography; and in situ observation of samples.
The JEM-2800 functions without the use of fluorescent screen. It is operated in a bright room.
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Get to know us: Associate Professor Maria Sammalkorpi
Sammalkorpi received her doctorate from Helsinki University of Technology 2004. After her defence, she has worked as a researcher at the Universities of Princeton, Yale and Aalto.
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